Material Characterisation
Powder X-ray Diffractometer
- PANalytical X’Pert PRO powder X-ray Diffractometer
- 15KVA UPS support
Micro Raman Spectrometer
- Imaging Spectrograph STR 500 mm Focal Length Laser Raman spectrometer
- Flat field : 27 mm(W) × 14 mm(H)
- Resolution : 1 / 0.6cm-1/pixel
Photo Luminescence
- Varian Cary Eclipse Photo Luminescence
- Spectrophotometer
- Oxford Low temperature LN2 77K set up
- High temperature 100 373K arrangement
FTIR spectrophotometer
- Model: Thermo Nicolet 380 FTIR spectrophotometer
- Wavelength range is 4000 to 400 cm-1
- Detector: DLaTGS detector
- Resolution: 0.5 cm-1
- S/N ratio: 2000:1 ppm for 1 minute scan
- Wavelength accuracy: 0.01 cm-1
UV-Vis-NIR spectrophotometer
- UV-DRS-spectrophotometer
- Thermofisher Evaluation 220
- 190-1100nm rangep
Surface Profilometer - Thickness and surface roughness measurement
- SJ-301 Mitutoyo Surface Profilometer
- Thickness and surface roughness measurement
SOLAR SIMULATOR
- Lamp irradiance: 1000 watts/m2 or above
- Type of lamp: LED Source
- Illumination area: 9 cm2
- I-V SYSTEM: Keithley system (model:2401)
SIMULTANEOUS DSC-TGA
- Ambient to 1500 Deg C
- Heating Rates from 0.1 to 100°C/min up to 1000°C & 25°/min till 1500°C
- DSC sensitivity: 4 Microwatts
- Weighing Accuracy /Precision: 0.005%/ 0.002%
Vibrating Sample Magnetometer
- Vibrating Sample Magnetometer with 4” (2.2 Tesla @ Room temperature) high temperature performance electromagnet
Atomic Force Microscope
- AFM 5100 Agilent Atomic Force Microscope with contact and non-contact modes, and tapping and mapping facilities
CH- Instrument – Electrochemical Work Station
- Electro chemical work station
Auto lab - Electrochemical impedance spectroscopy
- Auto lab Frequency Response analysis
- (Interfaced)
- Electrochemical impedance spectroscopy
Four Probe Resistivity measurement
- Linear Four Probe Resistivity measurement
- Keithley 2000 multimeter
Solar Simulator I-V/C-V
- Solar Simulator I-V/C-V & Pulsed I-V characterization system
Scanning potentiostat/Galvanostat
- Scanning potentiostat/Galvanostat
- PAREG&G,USA
DC, RF & Pulsed sputtering
- DC, RF & Pulsed sputtering with mass flow control
- Advance Tech. with 5 KVA support
- Substrate heater up to 800°C
- PAREG&G,USA
Thermal & Electron beam evaporation
- Vacuum coating unit
- Thermal evaporation
- Electron beam evaporation
Spin coater
- Spin coater
Planetary Ball-miller
- Retsch - Planetary Ball-miller PM 100
- Type C grinding bowls
- Maximum feed volume 250ml
- Maximum feed grain size upto< 6 mm
Photoacoustic spectrometer
- Photoacoustic spectrometer
- Indigeneously integrated
- Xenon source
- Chopper
- Standard Lock-in-amplifier
Tubular Furnace
- Tubular Furnace
- Two zones
- Heating range upto 1200
- Inert gas atmosphere
Glove box
- Glove box
- Inert atmosphere set up for Li-Battery fabrication
- < 6ppm H2O
Cryogenic constant temp. bath
- Computer controlled cryogenic constant temperature bath
- Temperature range 10°C to 75°C
- CFC refrigeration system
Czochralski Crystal Puller
- High Temperature (1200°C ) Czochralski Crystal Puller
- Pulling Speed : 0.3mm/hr to 15mm/hr
- Crystal Rotation Rate : 1 – 25rpm
- Growth Atmosphere – Argon and Oxygen – 2atm
Split tube single zone furnace
- THERMOLYNE- F 79440-33 Split tube single zone furnace
- Programmable (PID) with indicator controller backed by Thyrister control
- Multi programmable 4 stored programmer of 8 ramp and 8 dwells
- Working temperature range: 100 °C -1200 °C
Optical Microscope
- ATC 2000 Model Optical Microscope with Photographic equipment
- Trinocular optical microscope design
- Different optical lenses
High vacuum Furnace
- High vacuum Furnace
- Diffusion Pump: Size: 4 – ½ inch
- Pumping Speed: 500 lit/sec
- Ultimate Vacuum: 10-6 millibar
- Heater Capacity: 500 watts
- Liquid nitrogen trap Valves
- High Vacuum cooler
- Analog Pirani and Penning Gauge
Impedance spectrometer
- Frequency response analyser
- Impedance spectrometer
- Frequency range 0.1Hz - 40MHz
- Coretech
Hardness Tester
- Hardness Tester
Battery Tester
- Battery Tester